AZAM, M. .; NOUMAN, M.; GILL, . A. R. Comparative Analysis of Machine Learning Technique to Improve Software Defect Prediction: Comparative Analysis of Machine Learning Technique to Improve Software Defect Prediction. KIET Journal of Computing and Information Sciences, [S. l.], v. 5, n. 2, 2022. DOI: 10.51153/kjcis.v5i2.96. Disponível em: https://kjcis.kiet.edu.pk/index.php/kjcis/article/view/96. Acesso em: 17 nov. 2024.